X16 X-ray Inspection System
X16 X-ray Inspection System Price And Quantity
Minimum Order Quantity
1 Unit
Price
1.0 INR/Unit
X16 X-ray Inspection System Product Specifications
Material
NEW
Usage
Laboratory
Capacity
100 m/min
Product Description
The X16 system is the prime solution for medium-large food, and pharmaceutical products. This innovative x-ray inspection system delivers enhanced product quality and improved product safety.
Brand
Mettler Toledo
Capacity
100 m/min
Model
X16
CAT No.
30541252000
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Weight :
Approximately 120 kg
Frequency :
50/60 Hz
Display Type :
10.4inch color touchscreen interface (Chromera Software)
Feature :
Exceptional sensitivity, Allnew StayClean Source technology, rapid screening, minimal maintenance
Equipment Materials :
Stainless steel, specialized alloys and engineering polymers for robustness and chemical resistance
Accuracy :
High accuracy; attogram/fg range for target compound detection
Automation Grade :
Fully automated sample analysis
Temperature Range :
Ambient (for system operation)
Power Source :
AC Mains
Voltage :
220240 V
Core Components :
Ion source, triple quadrupole mass analyzer, vacuum system, ESI and APCI source
Measurement Range :
fg to ng (attogram to nanogram detection limits)
Dimension (L*W*H) :
103 cm 55 cm 55 cm
Usage :
Quantitative and confirmatory analysis in pharmaceutical, food safety, and environmental applications
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Type :
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Capacity :
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Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope
Weight :
Approx. 25 kg
Frequency :
Imaging scan rate: up to several Hz (typ. 0.52 Hz)
Display Type :
Digital/Computer Interface Display
Feature :
Highsensitivity measurement, lownoise scanning, easy sample exchange
Equipment Materials :
Highrigidity alloy and vibrationdamping materials
Accuracy :
Subnanometer vertical resolution
Automation Grade :
Manual, semiautomated operations
Temperature Range :
Ambient to 50C
Power Source :
AC 100240V, 50/60 Hz
Voltage :
100240V AC
Core Components :
Scanning unit, control electronics, probe scanner, imaging software
Measurement Range :
Lateral: up to 100 m, Vertical: up to 10 m
Dimension (L*W*H) :
Approx. 330 320 210 mm
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Single sample examination at nanometer scale
Bruker ALPHA II Compact FT-IR Spectrometer
Weight :
Approximately 7 kg
Frequency :
Interferometer Frequency: 7500 Hz; Spectral Range: 4000400 cm (standard)
Display Type :
Digital Touch Screen Interface
Feature :
Ultracompact size, QuickLock sample modules, easytouse software, robust design, minimal maintenance
Equipment Materials :
Aluminum body with protective cover and corrosionresistant components
Accuracy :
Wavenumber accuracy better than 0.01 cm
Automation Grade :
Semiautomatic / Automatic
Temperature Range :
Ambient (1535 C)
Power Source :
220 V / 5060 Hz AC
Voltage :
100240 V AC, 50/60 Hz
Core Components :
Michelson interferometer, DLATGS detector, IR source, DLaTGS detector, ATR/other sampling modules
Measurement Range :
4000400 cm (standard)
Dimension (L*W*H) :
22 cm 29 cm 16 cm
Usage :
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Weight :
Approx. 2 kg
Frequency :
50/60 Hz
Display Type :
Large, highcontrast TFT color display
Feature :
Multiparameter, dualchannel, ISM sensor compatibility, touch screen operation
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Polycarbonate housing with robust front display
Accuracy :
High measurement accuracy per sensor type, digital signal processing
Automation Grade :
Automatic
Temperature Range :
20C to +55C
Power Source :
AC powered (100240 V AC)
Voltage :
100240 V AC 10%
Core Components :
Microprocessor, TFT Display, Power Supply
Measurement Range :
Dependent on sensor, e.g., pH/ORP, conductivity, cation conductivity, dissolved oxygen, ozone, chlorine, TOC, and flow
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