Shimadzu Kratos AXIS Nova Imaging X-Ray Photoelectron Spectrometer

Shimadzu Kratos AXIS Nova Imaging X-Ray Photoelectron Spectrometer

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Product Details:

Accuracy Energy resolution up to 0.48 eV or better
Automation Grade Fully Automatic
Feature High spatial resolution imaging; automated sample transfer; low detection limits
Model No AXIS Nova
Measurement Range 01400 eV binding energy, element detection from Li (Z=3) upwards
Core Components Monochromatic Al K X-ray source, electron energy analyzer, sample handling system
Voltage 220-240 V
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Shimadzu Kratos AXIS Nova Imaging X-Ray Photoelectron Spectrometer Price And Quantity

Shimadzu Kratos AXIS Nova Imaging X-Ray Photoelectron Spectrometer Product Specifications

Capacity Up to 6 sample holders, compatible with large-area and multi-sample plates
Power Source AC mains, 220-240 V
Temperature Range Sample introduction at RT to 500C (with heating stage)
Equipment Materials Stainless steel chamber with UHV design, gold and sapphire-ceramic stage materials
Weight Approx. 650 kg (system)
Dimension (L*W*H) Approx. 1300 mm x 800 mm x 1950 mm
Frequency 50/60 Hz
Voltage 220-240 V
Core Components Monochromatic Al K X-ray source, electron energy analyzer, sample handling system
Model No AXIS Nova
Measurement Range 01400 eV binding energy, element detection from Li (Z=3) upwards
Display Type Computer-integrated digital interface
Usage Surface chemical analysis, elemental composition, and chemical state identification
Feature High spatial resolution imaging; automated sample transfer; low detection limits
Automation Grade Fully Automatic
Type Imaging X-Ray Photoelectron Spectrometer (XPS)
Accuracy Energy resolution up to 0.48 eV or better

Product Description

Brand Shimadzu

Model AXIS Nova

Capacity 10 nm

CAT No AXIS Nova

Application Spectroscopy

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.

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