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Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope
Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope
Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope

Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope

Product Details:

  • Power Source AC 100240V, 50/60 Hz
  • Accuracy Sub-nanometer vertical resolution
  • Voltage 100240V AC
  • Measurement Range Lateral: up to 100 m, Vertical: up to 10 m
  • Temperature Range Ambient to 50C
  • Capacity Single sample examination at nanometer scale
  • Feature High-sensitivity measurement, low-noise scanning, easy sample exchange
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Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Price And Quantity

Shimadzu SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Product Specifications

  • Sub-nanometer vertical resolution
  • High-rigidity alloy and vibration-damping materials
  • 100240V AC
  • Digital/Computer Interface Display
  • Surface morphology and property measurement at nanometer resolution
  • AC 100240V, 50/60 Hz
  • Approx. 330 320 210 mm
  • Manual, semi-automated operations
  • High-sensitivity measurement, low-noise scanning, easy sample exchange
  • Approx. 25 kg
  • Scanning unit, control electronics, probe scanner, imaging software
  • SPM-Nanoa
  • Imaging scan rate: up to several Hz (typ. 0.52 Hz)
  • Scanning Probe Microscope/Atomic Force Microscope
  • Lateral: up to 100 m, Vertical: up to 10 m
  • Ambient to 50C
  • Single sample examination at nanometer scale

Product Description

Brand                       Shimadzu

Model                       SPM-Nanoa

Capacity                  10 mm diameter

CAT No                    SPM-Nanoa

Application             Spectroscopy

The SPM-Nanoa scanning probe microscope includes an advanced high-sensitivity detection system and automatic observation function. This high-sensitivity instrument offers high-resolution observations, features a low-noise detection optical system, and automates optical adjustments and the work of setting the observation conditions. Even users unfamiliar with the operating procedures can effortlessly acquire high-resolution observation data. The SPM-Nanoa microscope provides powerful assistance for everything from observing the shape of micro areas to measuring their physical properties.

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