AXIS Imaging X-Ray Photoelectron Spectrometer

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Product Details:

Product Type Instrument
Material NEW
Model No AXIS Series
Capacity 1 sample holder, multiple sample loading capability
Voltage 220-240 V
Frequency 50/60 Hz
Core Components X-ray source, sample stage, electron energy analyzer, vacuum system, detector
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AXIS Imaging X-Ray Photoelectron Spectrometer Price And Quantity

Minimum Order Quantity 1 Unit

AXIS Imaging X-Ray Photoelectron Spectrometer Product Specifications

Display Type Graphical user interface (GUI) with computer system
Dimension (L*W*H) Typically around 1200mm x 950mm x 1700mm
Material NEW
Product Type Instrument
Capacity 1 sample holder, multiple sample loading capability
Voltage 220-240 V
Model No AXIS Series
Accuracy Energy resolution typically < 0.5 eV
Power Source AC mains electricity
Equipment Materials Stainless steel chamber, specialized analytical materials
Temperature Range Room temperature to ambient-controlled operations
Type X-Ray Photoelectron Spectrometer (XPS)
Core Components X-ray source, sample stage, electron energy analyzer, vacuum system, detector
Frequency 50/60 Hz
Weight Approximately 500 kg (varies with model/configuration)
Measurement Range 0 - 1400 eV binding energy
Feature High spatial resolution imaging and quantitative analysis
Automation Grade Fully automated operations
Usage Laboratory

Analytical Modes Wide scan, narrow scan, depth profiling, angular-resolved XPS, mapping
Spatial Resolution Down to 3 m
Sample Size Up to 110 mm in diameter
Safety Features Interlocked doors, emergency shut-off
Ion Gun Available for sputter depth profiling (optional)
Operating Environment Temperature: 15-28C, Humidity: < 80% RH
Vacuum System Ultra-high vacuum capability, typically < 1 109 mbar
Detector Type Hemispherical electron energy analyzer with multi-channel detector
Communication Ports USB, Ethernet for remote operation/data export
Data Acquisition Software Integrated imaging and analysis software, Windows-based
X-ray Source Mono-chromated Al K (1486.7 eV), dual anode

Product Description

X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS (also known as Kratos Ultra 2 in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available.

Brand	Shimadzu
Capacity	10 nm
Application	Spectroscopy
CAT No.	AXIS

Ultra-High Vacuum and Precision Analysis

Designed for advanced material characterization, the AXIS Imaging XPS provides ultra-high vacuum (UHV) capabilities, enabling sensitive electron analysis with minimal interference. The mono-chromated Al K source, dual anode, and hemispherical analyzer ensure accurate, reproducible results across a variety of analytical modes.

User-Friendly Interface and Automation

The system is fully automated, integrating a graphical user interface (GUI) with Windows-based software for streamlined imaging, mapping, and data analysis. Remote operation support via USB and Ethernet enhances accessibility and data export, making this spectrometer adaptable to diverse laboratory workflows.

Versatility in Research and Industrial Applications

Accommodating samples up to 110 mm, the AXIS Imaging XPS supports depth profiling (optional ion gun), wide/narrow scan, and angular-resolved XPS, ensuring high utility for academic, industrial, and quality control laboratories. Its robust construction and safety features foster reliability and secure operation.

FAQ's of AXIS Imaging X-Ray Photoelectron Spectrometer:

Q: How does the AXIS Imaging XPS achieve ultra-high vacuum conditions for accurate analysis?

A: The AXIS Imaging X-Ray Photoelectron Spectrometer is equipped with an advanced vacuum system capable of reaching pressures below 1 109 mbar. This ultra-high vacuum minimizes contamination and background signals, enabling precise electron detection and accurate surface characterization.

Q: What types of samples and sizes can be analyzed with this spectrometer?

A: This instrument supports samples up to 110 mm in diameter. It is suitable for a wide range of solids, including metals, polymers, and complex materials, making it versatile for routine laboratory analysis, research, quality control, and industrial applications.

Q: When should I use depth profiling or mapping analytical modes?

A: Depth profiling is ideal when you need to determine the elemental composition beneath a sample's surface, such as for coatings, thin films, or multilayer structures. Mapping mode is recommended for visualizing spatial distribution of elements or chemistry across the sample surface.

Q: Where is the data acquired by the system stored and how can it be exported?

A: Data is captured directly on the integrated computer via Windows-based imaging software. Exporting is straightforward, using USB or Ethernet communication ports for transferring results and reports to external devices or networked data storage.

Q: What is the process for analyzing a sample using the AXIS Imaging XPS?

A: Begin by mounting your sample onto the holder, load it into the vacuum chamber, and select the desired analytical mode via the GUI. The automated system manages vacuum generation, X-ray exposure, electron detection, and data acquisition-all with minimal operator intervention.

Q: How does this equipment enhance laboratory productivity and safety?

A: Its full automation, user-friendly interface, and quick sample throughput streamline workflow, reducing analysis times. Safety is prioritized with interlocked doors and emergency shut-off functions, protecting both users and samples during operation.

Q: What are the benefits of using the AXIS Imaging XPS in research and quality control?

A: This spectrometer provides quantitative, high-resolution elemental analysis, enabling detailed characterization of materials' surfaces and interfaces. Its precision, high spatial resolution, and comprehensive analytical capabilities deliver reliable data for advanced research and stringent quality assurance.

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